Book Image

Dynamic System Reliability

By : Liudong Xing, Gregory Levitin, Chaonan Wang
Book Image

Dynamic System Reliability

By: Liudong Xing, Gregory Levitin, Chaonan Wang

Overview of this book

This book focuses on hot issues of dynamic system reliability, systematically introducing the reliability modeling and analysis methods for systems with imperfect fault coverage, systems with function dependence, systems subject to deterministic or probabilistic common-cause failures, systems subject to deterministic or probabilistic competing failures, and dynamic standby sparing systems. It presents recent developments of such extensions involving reliability modeling theory, reliability evaluation methods, and features numerous case studies based on real-world examples. The presented dynamic reliability theory can enable a more accurate representation of actual complex system behavior, thus more effectively guiding the reliable design of real-world critical systems. The book begins by describing the evolution from the traditional static reliability theory to the dynamic system reliability theory and provides a detailed investigation of dynamic and dependent behaviors in subsequent chapters. Although written for those with a background in basic probability theory and stochastic processes, the book includes a chapter reviewing the fundamentals that readers need to know in order to understand the contents of other chapters that cover advanced topics in reliability theory and case studies.
Table of Contents (14 chapters)
Free Chapter
1 Introduction
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ACP Application Communication Phase
BDD Binary Decision Diagram
BEM BDD Expansion Method
BSN Body Sensor Network
CC Common Cause
CCE Common‐Cause Event
CCF Common‐Cause Failure
CCG Common‐Cause Group
cdf cumulative distribution function
CLT Central Limit Theorem
CM Computing Module
CPR Combinatorial Phase Requirement
CSP Cold SPare
CTE Combined Trigger Event
CTMC Continuous Time Markov Chain
DC Dependent Component
DD Decision Diagram
DFT Dynamic Fault Tree
EDA Efficient Decomposition and Aggregation
ELC Element Level Coverage
EMB External Memory Block
FCE Failure Competition Event
FDEP Functional DEPendence
FDG Functional Dependence Group
FLC Fault Level Coverage
FT Fault Tree
FTS Fault Tolerant System
HS Hierarchical System
HSP Hot SPare
IC Interface Chip
ICP Infrastructure Communication Phase
IFG Isolation Factor Group
i.i.d. independent and identically distributed
IoT Internet of Things
IPC ImPerfect Coverage
ite if‐then‐else
ITE Independent Trigger Event
LF Local Failure
MC Memory Chip
MFT Multi‐state Fault Tree
MIU Memory Interface Unit
MM Memory Module
MMDD Multi‐state Multi‐valued Decision Diagram
MRL Mean Residual Life
MSS Multi‐State System
MTBF Mean Time Between Failures
MTTF Mean Time To Failure
MTTR Mean Time To Repair
NDC NonDependent Component
OBDD Ordered BDD
PAND Priority AND
PCCE Probabilistic Common‐Cause Event
PCCF Probabilistic Common‐Cause Failure
PCCG Probabilistic Common‐Cause Group
PDC Performance Dependent Coverage
PDEP Probabilistic‐DEPendent
pdf probability density function
PDO Phase Dependent Operation
PF Propagated Failure
PFD Probabilistic Functional Dependence
PFDC Probabilistic Functional Dependence Case
PFGE Propagated Failure with Global Effect
PFSE Propagated Failure with Selective Effect
pmf probability mass function
PMS Phased‐Mission System
PTC PorT Chip
RAP Redundancy Allocation Problem
r.v. random variable
SBDD Sequential BDD
SEA Simple and Efficient Algorithm
SEQ SEQquence enforcing
SESP Standby Element Sequencing Problem
SFT Static Fault Tree
ttf time to failure
UF Uncovered Failure
u‐function universal generating function
WSN Wireless Sensor Network
WSP Warm SPare