Book Image

Dynamic System Reliability

By : Liudong Xing, Gregory Levitin, Chaonan Wang
Book Image

Dynamic System Reliability

By: Liudong Xing, Gregory Levitin, Chaonan Wang

Overview of this book

This book focuses on hot issues of dynamic system reliability, systematically introducing the reliability modeling and analysis methods for systems with imperfect fault coverage, systems with function dependence, systems subject to deterministic or probabilistic common-cause failures, systems subject to deterministic or probabilistic competing failures, and dynamic standby sparing systems. It presents recent developments of such extensions involving reliability modeling theory, reliability evaluation methods, and features numerous case studies based on real-world examples. The presented dynamic reliability theory can enable a more accurate representation of actual complex system behavior, thus more effectively guiding the reliable design of real-world critical systems. The book begins by describing the evolution from the traditional static reliability theory to the dynamic system reliability theory and provides a detailed investigation of dynamic and dependent behaviors in subsequent chapters. Although written for those with a background in basic probability theory and stochastic processes, the book includes a chapter reviewing the fundamentals that readers need to know in order to understand the contents of other chapters that cover advanced topics in reliability theory and case studies.
Table of Contents (14 chapters)
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1 Introduction
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3.2 ELC Modeling

In the seminal paper by Bouricius et al. [16], a fault coverage factor in ELC was defined as the conditional probability that a system can recover its function successfully given that a component fault has occurred. It measures a system's capability to perform fault detection, location, containment, and/or recovery when a component fault occurs in the system.

This section describes the imperfect coverage model (IPCM) introduced by Dugan and Trivedi, as illustrated in Figure 3.1 [7]. The subsequent sections present the incorporation of IPCM in reliability analysis of different types of systems including binary‐state systems, multi‐state systems, and multi‐phase systems.

Structure of IPCM for component i, depicted by a rectangle labeled imperfect coverage model with a outward arrows labeled exit S (single-point failure), exit C (permanent coverage), and exit R (transit restoration).

Figure 3.1 Structure of IPCM for component i [7].

The IPCM is associated with a particular system component i and has a single entry point representing the occurrence of the component fault. The model also has three disjoint exits R, C, S, representing all the possible outcomes...