Book Image

Dynamic System Reliability

By : Liudong Xing, Gregory Levitin, Chaonan Wang
Book Image

Dynamic System Reliability

By: Liudong Xing, Gregory Levitin, Chaonan Wang

Overview of this book

This book focuses on hot issues of dynamic system reliability, systematically introducing the reliability modeling and analysis methods for systems with imperfect fault coverage, systems with function dependence, systems subject to deterministic or probabilistic common-cause failures, systems subject to deterministic or probabilistic competing failures, and dynamic standby sparing systems. It presents recent developments of such extensions involving reliability modeling theory, reliability evaluation methods, and features numerous case studies based on real-world examples. The presented dynamic reliability theory can enable a more accurate representation of actual complex system behavior, thus more effectively guiding the reliable design of real-world critical systems. The book begins by describing the evolution from the traditional static reliability theory to the dynamic system reliability theory and provides a detailed investigation of dynamic and dependent behaviors in subsequent chapters. Although written for those with a background in basic probability theory and stochastic processes, the book includes a chapter reviewing the fundamentals that readers need to know in order to understand the contents of other chapters that cover advanced topics in reliability theory and case studies.
Table of Contents (14 chapters)
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1 Introduction
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3.3 Binary‐State System

This section presents an explicit method, referred to as BDD expansion method (Section 3.3.1), and an implicit method named simple and efficient algorithm (SEA) (Section 3.3.2) for reliability analysis of binary‐state systems considering effects of ELC modeled using the IPCM.

3.3.1 BDD Expansion Method

The BDD expansion method (BEM) addresses effects of ELC by explicitly inserting the IPCM in the path for components experiencing uncovered faults during traversal of the system BDD model (Section 2.4) [18]. Figure 3.2 illustrates the idea, where when node i can experience an uncovered fault and is traversed, the IPCM is inserted on the path led by the right branch (1‐edge) of node i. Both the original left branch (representing no fault occurring) and the exit R from the IPCM point to NFi; the exit C points to Fi; the exit S points to sink node 1 directly since an uncovered component fault leads to the failure of the entire system.

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