Book Image

Dynamic System Reliability

By : Liudong Xing, Gregory Levitin, Chaonan Wang
Book Image

Dynamic System Reliability

By: Liudong Xing, Gregory Levitin, Chaonan Wang

Overview of this book

This book focuses on hot issues of dynamic system reliability, systematically introducing the reliability modeling and analysis methods for systems with imperfect fault coverage, systems with function dependence, systems subject to deterministic or probabilistic common-cause failures, systems subject to deterministic or probabilistic competing failures, and dynamic standby sparing systems. It presents recent developments of such extensions involving reliability modeling theory, reliability evaluation methods, and features numerous case studies based on real-world examples. The presented dynamic reliability theory can enable a more accurate representation of actual complex system behavior, thus more effectively guiding the reliable design of real-world critical systems. The book begins by describing the evolution from the traditional static reliability theory to the dynamic system reliability theory and provides a detailed investigation of dynamic and dependent behaviors in subsequent chapters. Although written for those with a background in basic probability theory and stochastic processes, the book includes a chapter reviewing the fundamentals that readers need to know in order to understand the contents of other chapters that cover advanced topics in reliability theory and case studies.
Table of Contents (14 chapters)
Free Chapter
1 Introduction
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3.6 Summary

This chapter discusses imperfect fault coverage, an inherent behavior of FTSs. While there exist diverse types of imperfect coverage (e.g. ELC, FLC, and PDC), this chapter focuses on the modeling and analysis of ELC modeled by the IPCM. Under the IPCM, each component is associated with a set of three coverage factors, reflecting the effectiveness of the system recovery and reconfiguration mechanism in the case of a fault occurring to this component. Both an explicit method based on BDD (called BEM) and an implicit method based on the total probability law (called SEA) are discussed for the reliability analysis of binary‐state systems subject to the ELC. Extensions of the SEA method for analyzing multi‐state systems and phased‐mission systems subject to the ELC are further presented. The SEA methodology enables the users to apply reliability analysis software that does not consider ELC (e.g. BDD for binary‐state systems, MMDD for multi‐state...