Book Image

Dynamic System Reliability

By : Liudong Xing, Gregory Levitin, Chaonan Wang
Book Image

Dynamic System Reliability

By: Liudong Xing, Gregory Levitin, Chaonan Wang

Overview of this book

This book focuses on hot issues of dynamic system reliability, systematically introducing the reliability modeling and analysis methods for systems with imperfect fault coverage, systems with function dependence, systems subject to deterministic or probabilistic common-cause failures, systems subject to deterministic or probabilistic competing failures, and dynamic standby sparing systems. It presents recent developments of such extensions involving reliability modeling theory, reliability evaluation methods, and features numerous case studies based on real-world examples. The presented dynamic reliability theory can enable a more accurate representation of actual complex system behavior, thus more effectively guiding the reliable design of real-world critical systems. The book begins by describing the evolution from the traditional static reliability theory to the dynamic system reliability theory and provides a detailed investigation of dynamic and dependent behaviors in subsequent chapters. Although written for those with a background in basic probability theory and stochastic processes, the book includes a chapter reviewing the fundamentals that readers need to know in order to understand the contents of other chapters that cover advanced topics in reliability theory and case studies.
Table of Contents (14 chapters)
Free Chapter
1 Introduction
End User License Agreement

4.1 Modular Imperfect Coverage Model

The modular imperfect coverage model (MIPCM) was first introduced in [2] to analyze effects of the multiple levels of uncovered failure (UF) modes for components in HSs. Figure 4.1 illustrates the general structure of MIPCM for a component located at layer i of an HS with a total of L layers.

Image described by caption and surrounding text.

Figure 4.1 General structure of MIPCM [2] .

Similar to the one‐level imperfect coverage model (IPCM) discussed in Chapter 3, the entry point of MIPCM represents that a component located at layer i experiences a fault. The (L − i + 3) exits represent all possible outcomes of the fault recovery process triggered by the occurrence of the component fault. The exits R and C have the same meaning as in the traditional IPCM in Figure 3.1. The remaining (L − i + 1) exits correspond to different levels of component UF modes. Particularly, if the component uncovered fault happening in layer...