4.1 Modular Imperfect Coverage Model
The modular imperfect coverage model (MIPCM) was first introduced in [2] to analyze effects of the multiple levels of uncovered failure (UF) modes for components in HSs. Figure 4.1 illustrates the general structure of MIPCM for a component located at layer i of an HS with a total of L layers.
Similar to the one‐level imperfect coverage model (IPCM) discussed in Chapter 3, the entry point of MIPCM represents that a component located at layer i experiences a fault. The (L − i + 3) exits represent all possible outcomes of the fault recovery process triggered by the occurrence of the component fault. The exits R and C have the same meaning as in the traditional IPCM in Figure 3.1. The remaining (L − i + 1) exits correspond to different levels of component UF modes. Particularly, if the component uncovered fault happening in layer...