Book Image

Dynamic System Reliability

By : Liudong Xing, Gregory Levitin, Chaonan Wang
Book Image

Dynamic System Reliability

By: Liudong Xing, Gregory Levitin, Chaonan Wang

Overview of this book

This book focuses on hot issues of dynamic system reliability, systematically introducing the reliability modeling and analysis methods for systems with imperfect fault coverage, systems with function dependence, systems subject to deterministic or probabilistic common-cause failures, systems subject to deterministic or probabilistic competing failures, and dynamic standby sparing systems. It presents recent developments of such extensions involving reliability modeling theory, reliability evaluation methods, and features numerous case studies based on real-world examples. The presented dynamic reliability theory can enable a more accurate representation of actual complex system behavior, thus more effectively guiding the reliable design of real-world critical systems. The book begins by describing the evolution from the traditional static reliability theory to the dynamic system reliability theory and provides a detailed investigation of dynamic and dependent behaviors in subsequent chapters. Although written for those with a background in basic probability theory and stochastic processes, the book includes a chapter reviewing the fundamentals that readers need to know in order to understand the contents of other chapters that cover advanced topics in reliability theory and case studies.
Table of Contents (14 chapters)
Free Chapter
1 Introduction
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4.2 Nonrepairable Hierarchical System

Based on the simple and efficient algorithm (SEA) of [7,8] for addressing the one‐level IPCM, Figure 4.2 illustrates a general solution methodology of analyzing an HS subject to the modular imperfect fault coverage. The HS fault tree (FT) is composed of independent fault subtrees for each layer. The layer subtrees are then solved in a hierarchical and bottom‐up manner, where a subtree is replaced by a single component in its parent layer subtrees whose occurrence probability is the occurrence probability of the corresponding layer subtree.

Hierarchical FT solution to consider MIPCM displaying shaded node labeled Ai to box for PFDEP, to nodes labeled UFi, UFi+1, and UFL, leading to box labeled top layer L FT subtree, to HS failure.

Figure 4.2 Hierarchical FT solution to consider MIPCM [5] .

The probabilistic functional dependency (PFDEP) gate in Figure 4.2 has a trigger input event (representing the occurrence of an uncovered component fault at layer i), and one or more dependent events (UF events of different layers). When the trigger event happens, the dependent events are then forced to occur with certain (different...