Book Image

Dynamic System Reliability

By : Liudong Xing, Gregory Levitin, Chaonan Wang
Book Image

Dynamic System Reliability

By: Liudong Xing, Gregory Levitin, Chaonan Wang

Overview of this book

This book focuses on hot issues of dynamic system reliability, systematically introducing the reliability modeling and analysis methods for systems with imperfect fault coverage, systems with function dependence, systems subject to deterministic or probabilistic common-cause failures, systems subject to deterministic or probabilistic competing failures, and dynamic standby sparing systems. It presents recent developments of such extensions involving reliability modeling theory, reliability evaluation methods, and features numerous case studies based on real-world examples. The presented dynamic reliability theory can enable a more accurate representation of actual complex system behavior, thus more effectively guiding the reliable design of real-world critical systems. The book begins by describing the evolution from the traditional static reliability theory to the dynamic system reliability theory and provides a detailed investigation of dynamic and dependent behaviors in subsequent chapters. Although written for those with a background in basic probability theory and stochastic processes, the book includes a chapter reviewing the fundamentals that readers need to know in order to understand the contents of other chapters that cover advanced topics in reliability theory and case studies.
Table of Contents (14 chapters)
Free Chapter
1 Introduction
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6.1 Explicit Method

The basic idea of the explicit method is to evaluate an expanded system model that is constructed by modeling the occurrence of each CC as a basic event shared by all the components affected by this CC in the original system model [8,9].

6.1.1 Two‐Step Method

The explicit method involves a two‐step process given below.

  • Step 1: Build an expanded FT. To consider effects of CCFs, a logic OR gate is introduced for each component affected by at least one CC, and each CC is modeled as a repeated input event to all component OR‐gates failed by this CC.
  • Step 2: Evaluate the expanded FT. The expanded FT can be evaluated using any traditional FT reliability analysis method, e.g. the binary decision diagram (BDD)‐based method (Section 2.4) to obtain the system unreliability, considering effects of CCFs.

6.1.2 Illustrative Example