Book Image

Dynamic System Reliability

By : Liudong Xing, Gregory Levitin, Chaonan Wang
Book Image

Dynamic System Reliability

By: Liudong Xing, Gregory Levitin, Chaonan Wang

Overview of this book

This book focuses on hot issues of dynamic system reliability, systematically introducing the reliability modeling and analysis methods for systems with imperfect fault coverage, systems with function dependence, systems subject to deterministic or probabilistic common-cause failures, systems subject to deterministic or probabilistic competing failures, and dynamic standby sparing systems. It presents recent developments of such extensions involving reliability modeling theory, reliability evaluation methods, and features numerous case studies based on real-world examples. The presented dynamic reliability theory can enable a more accurate representation of actual complex system behavior, thus more effectively guiding the reliable design of real-world critical systems. The book begins by describing the evolution from the traditional static reliability theory to the dynamic system reliability theory and provides a detailed investigation of dynamic and dependent behaviors in subsequent chapters. Although written for those with a background in basic probability theory and stochastic processes, the book includes a chapter reviewing the fundamentals that readers need to know in order to understand the contents of other chapters that cover advanced topics in reliability theory and case studies.
Table of Contents (14 chapters)
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1 Introduction
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7.1 Single‐Phase System

The system contains components with (different) individual failure probabilities. Some components can fail also as a result of different common causes (CCs). These CCs can be associated with failures of other system components or with some external shocks. The system structure function is given in the form of a fault tree (FT) model [4], which defines the entire system state for any combination of the component states.

The PCCF gate (Figure 7.1) is used to model the PCCF behavior [5]. This gate is designed based on the FDEP gate [2] . The input of the PCCF gate is a trigger event representing the occurrence of a certain CC. The gate also has one or more dependent events representing failures of system components affected by the CC; these dependent components form a probabilistic common‐cause group (PCCG). When the trigger event occurs, the dependent events are forced to occur with certain (maybe different) probabilities, represented by switch symbols...