Book Image

Dynamic System Reliability

By : Liudong Xing, Gregory Levitin, Chaonan Wang
Book Image

Dynamic System Reliability

By: Liudong Xing, Gregory Levitin, Chaonan Wang

Overview of this book

This book focuses on hot issues of dynamic system reliability, systematically introducing the reliability modeling and analysis methods for systems with imperfect fault coverage, systems with function dependence, systems subject to deterministic or probabilistic common-cause failures, systems subject to deterministic or probabilistic competing failures, and dynamic standby sparing systems. It presents recent developments of such extensions involving reliability modeling theory, reliability evaluation methods, and features numerous case studies based on real-world examples. The presented dynamic reliability theory can enable a more accurate representation of actual complex system behavior, thus more effectively guiding the reliable design of real-world critical systems. The book begins by describing the evolution from the traditional static reliability theory to the dynamic system reliability theory and provides a detailed investigation of dynamic and dependent behaviors in subsequent chapters. Although written for those with a background in basic probability theory and stochastic processes, the book includes a chapter reviewing the fundamentals that readers need to know in order to understand the contents of other chapters that cover advanced topics in reliability theory and case studies.
Table of Contents (14 chapters)
Free Chapter
1 Introduction
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8.4 Single‐Phase System with Multiple FDEP Groups

This section considers the reliability analysis of a single‐phase system subject to competing failures involved in multiple dependent FDEP groups. The method is applicable to any arbitrary ttf distributions for the system components.

8.4.1 Combinatorial Method

The combinatorial method contains the following three steps [12]:

  • Step 1: Construct an event space based on statuses of trigger components. Given m trigger components (denoted by Ti, i = 1 ,…, m) involved in FDEPs, an event space consists of 2m events, each called a combined trigger event (CTE), and is constructed as follows: imagesCTE0=T1¯T2¯Tm¯--imagesCTE1=T¯1T2¯Tm--imagesCTE2m1=T1T2Tm-- [9] , the system unreliability is evaluated as
    (8.31)equation UR system t = i = 0 2 m 1 P system failure | CTE i · P CTE i . --
  • Step...